summaryrefslogtreecommitdiff
path: root/tests/vsp-unit-test-0011.sh
diff options
context:
space:
mode:
authorLaurent Pinchart <laurent.pinchart@ideasonboard.com>2016-09-12 23:10:12 +0300
committerLaurent Pinchart <laurent.pinchart@ideasonboard.com>2016-09-13 01:07:08 +0300
commit927cff1a910d2bd551e97f24f55255dac12f0244 (patch)
tree6f67d8f187fa6ce55698b0597ad8e74c9f830d13 /tests/vsp-unit-test-0011.sh
parent43574dfc8c4b8555e7fd62bf60a4a002e63b64d7 (diff)
tests: Lower flip test resolution
Testing all combinations of flipping and rotation is time consuming, speed it up by lowering the resolution to 640x480. Signed-off-by: Laurent Pinchart <laurent.pinchart@ideasonboard.com>
Diffstat (limited to 'tests/vsp-unit-test-0011.sh')
-rwxr-xr-xtests/vsp-unit-test-0011.sh2
1 files changed, 1 insertions, 1 deletions
diff --git a/tests/vsp-unit-test-0011.sh b/tests/vsp-unit-test-0011.sh
index 19266cf..17f8405 100755
--- a/tests/vsp-unit-test-0011.sh
+++ b/tests/vsp-unit-test-0011.sh
@@ -77,7 +77,7 @@ test_flipping() {
test_start "$label"
pipe_configure rpf-wpf 0 0
- format_configure rpf-wpf 0 0 $format 1024x768 $format
+ format_configure rpf-wpf 0 0 $format 640x480 $format
vsp_runner rpf.0 &
vsp_runner wpf.0