From 927cff1a910d2bd551e97f24f55255dac12f0244 Mon Sep 17 00:00:00 2001 From: Laurent Pinchart Date: Mon, 12 Sep 2016 23:10:12 +0300 Subject: tests: Lower flip test resolution Testing all combinations of flipping and rotation is time consuming, speed it up by lowering the resolution to 640x480. Signed-off-by: Laurent Pinchart --- tests/vsp-unit-test-0011.sh | 2 +- 1 file changed, 1 insertion(+), 1 deletion(-) (limited to 'tests/vsp-unit-test-0011.sh') diff --git a/tests/vsp-unit-test-0011.sh b/tests/vsp-unit-test-0011.sh index 19266cf..17f8405 100755 --- a/tests/vsp-unit-test-0011.sh +++ b/tests/vsp-unit-test-0011.sh @@ -77,7 +77,7 @@ test_flipping() { test_start "$label" pipe_configure rpf-wpf 0 0 - format_configure rpf-wpf 0 0 $format 1024x768 $format + format_configure rpf-wpf 0 0 $format 640x480 $format vsp_runner rpf.0 & vsp_runner wpf.0 -- cgit v1.2.3