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diff --git a/tests/vsp-unit-test-0027.sh b/tests/vsp-unit-test-0027.sh
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+++ b/tests/vsp-unit-test-0027.sh
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+#!/bin/sh
+# SPDX-License-Identifier: GPL-2.0-or-later
+# SPDX-FileCopyrightText: 2017-2022 Renesas Electronics Corporation
+
+#
+# Test RPF crop using multiplanar YUV formats, test buffer offset calculation
+# with subsampling. Use a RPF -> WPF pipeline, passing a selection of cropping
+# windows.
+#
+
+. ./vsp-lib.sh
+
+features="rpf.0 wpf.0"
+crops="(0,0)/512x384 (32,32)/512x384 (32,64)/512x384 (64,32)/512x384"
+formats="NV12M NV16M YUV420M YUV422M YUV444M"
+
+test_rpf_cropping() {
+	local format=$1
+	local crop=$2
+
+	test_start "RPF crop from $crop in $format"
+
+	pipe_configure rpf-wpf 0 0
+	format_configure rpf-wpf 0 0 $format 1024x768 YUV444M --rpfcrop=$crop
+
+	vsp_runner rpf.0 &
+	vsp_runner wpf.0
+
+	local result=$(compare_frames crop=${crop})
+
+	test_complete $result
+}
+
+test_main() {
+	local crop
+	local format
+
+	for format in $formats ; do
+		for crop in $crops ; do
+			test_rpf_cropping $format $crop
+		done
+	done
+}
+
+test_init $0 "$features"
+test_run