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| author | Laurent Pinchart <laurent.pinchart@ideasonboard.com> | 2016-09-12 23:10:12 +0300 |
|---|---|---|
| committer | Laurent Pinchart <laurent.pinchart@ideasonboard.com> | 2016-09-13 01:07:08 +0300 |
| commit | 927cff1a910d2bd551e97f24f55255dac12f0244 (patch) | |
| tree | 6f67d8f187fa6ce55698b0597ad8e74c9f830d13 | |
| parent | 43574dfc8c4b8555e7fd62bf60a4a002e63b64d7 (diff) | |
tests: Lower flip test resolution
Testing all combinations of flipping and rotation is time consuming,
speed it up by lowering the resolution to 640x480.
Signed-off-by: Laurent Pinchart <laurent.pinchart@ideasonboard.com>
| -rwxr-xr-x | tests/vsp-unit-test-0011.sh | 2 |
1 files changed, 1 insertions, 1 deletions
diff --git a/tests/vsp-unit-test-0011.sh b/tests/vsp-unit-test-0011.sh index 19266cf..17f8405 100755 --- a/tests/vsp-unit-test-0011.sh +++ b/tests/vsp-unit-test-0011.sh @@ -77,7 +77,7 @@ test_flipping() { test_start "$label" pipe_configure rpf-wpf 0 0 - format_configure rpf-wpf 0 0 $format 1024x768 $format + format_configure rpf-wpf 0 0 $format 640x480 $format vsp_runner rpf.0 & vsp_runner wpf.0 |