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(parent: 43574df) | patch
tests: Lower flip test resolution
authorLaurent Pinchart <laurent.pinchart@ideasonboard.com>
Mon, 12 Sep 2016 20:10:12 +0000 (23:10 +0300)
committerLaurent Pinchart <laurent.pinchart@ideasonboard.com>
Mon, 12 Sep 2016 22:07:08 +0000 (01:07 +0300)
commit927cff1a910d2bd551e97f24f55255dac12f0244
tree6f67d8f187fa6ce55698b0597ad8e74c9f830d13tree | snapshot
parent43574dfc8c4b8555e7fd62bf60a4a002e63b64d7commit | diff
tests: Lower flip test resolution

Testing all combinations of flipping and rotation is time consuming,
speed it up by lowering the resolution to 640x480.

Signed-off-by: Laurent Pinchart <laurent.pinchart@ideasonboard.com>
tests/vsp-unit-test-0011.sh diff | blob | history
VSP test framework