From 683855f65523c978562ead56f9d68f50ffdca1a2 Mon Sep 17 00:00:00 2001 From: Eric Anholt Date: Tue, 3 Jan 2012 14:32:18 -0800 Subject: intel: Add regression tests for batch decode. The .batch was generated using the dump-a-batch branch of git://people.freedesktop.org/~anholt/mesa using glxgears on gen7 hardware, using INTEL_DEVID_OVERRIDE for non-gen7 (this means that offsets in the buffers for non-gen7 are 0!). The .ref was generated by: ./test_decode tests/gen7-3d.batch -dump. The .sh exists because you can't supply arguments to tests using the simple automake tests driver. Something reasonable could be done using automake's parallel-tests driver (in fact, a previous version of the patch did that), but I was concerned that: 1) The parallel-tests driver is documented to be unstable -- they may change interfaces on us later. 2) The parallel-tests driver hides the output of tests in .log files scattered all over the tree, which was ugly and more painful to work with. v2: Actually add the batch files, add a .gitignore for the *-new.txt files added after failures, and fix failure mode for undetected chipset name. Reviewed-by: Daniel Vetter (v1) --- intel/tests/gen6-3d.batch | Bin 0 -> 3960 bytes 1 file changed, 0 insertions(+), 0 deletions(-) create mode 100644 intel/tests/gen6-3d.batch (limited to 'intel/tests/gen6-3d.batch') diff --git a/intel/tests/gen6-3d.batch b/intel/tests/gen6-3d.batch new file mode 100644 index 00000000..d57147e9 Binary files /dev/null and b/intel/tests/gen6-3d.batch differ -- cgit v1.2.3